"De-embedding is a post-processing technique specifically applied to S-parameters, aiming to eliminate energy losses caused by test fixtures, probes, test points, vias, and other structures from the S-parameters of the device under test. These structures can adversely impact the S-parameters, leading to overestimated loss values or introducing jitter. In applications where precise S-parameters are crucial, it may be necessary to remove these influences to restore the inherent characteristics of the device under test. The most common practice involves removing probes or test fixtures, typically achieved using AFR or 2xThru algorithms. Arcanum Advanced Inc. provides various post-processing methods to assist clients in obtaining more accurate measurement values."

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