S Parameter Measurement

S-parameters (Scattering Parameters) are fundamental electrical parameters in circuit design, often represented in the form of 2-port or 4-port configurations. A 4-port S-parameter set includes 16 elements. S-parameters express the ratio of incident energy to received energy, with commonly used metrics being Insertion Loss and Return Loss. Measurements of S-parameters are typically conducted using a Vector Network Analyzer (VNA) in conjunction with appropriate probes, connectors, or fixtures.

  • Arcanum Advanced Inc. has established VNA equipment for the following measurements:
  • Support for Single Ended and Differential testing, measuring .s2p and .s4p
  • Support for in-board testing and needle testing under BGA areas*
  • Testing frequency - Up to 40 GHz
  • Testing point pitch - 0.1 ~ 1.5 mm*.

**In-board testing utilizes probe stations with microscopes for testing.
**Testing point pitch refers to the pitch of the probes and does not consider pad size. For details, please contact us for evaluation.

  • Capability for Probe or Test Fixture De-embedding
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